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| RN1307~RN1309 TOSHIBA Transistor Silicon NPN Epitaxial Type (PCT Process) RN1307,RN1308,RN1309 Switching, Inverter Circuit, Interface Circuit And Driver Circuit Applications l With built-in bias resistors. l Simplify circuit design l Reduce a quantity of parts and manufacturing process l Complementary to RN2307~RN2309 Unit: mm Equivalent Circuit and Bias Resistor Values Type No. RN2207 RN2208 RN2209 R1 (k) 10 22 47 R2 (k) 47 47 22 Maximum Ratings (Ta = 25C) Characteristic Collector-base voltage Collector-emitter voltage RN1307 Emitter-base voltage RN1308 RN1309 Collector current Collector power dissipation Junction temperature Storage temperature range Ic Pc Tj Tstg VEBO Symbol VCBO VCEO Rating 50 50 6 7 15 100 100 150 -55~150 JEDEC EIAJ TOSHIBA Weight: 0.006g Unit V V SC-70 2-2E1A V mA mW C C 1 2001-06-07 RN1307~RN1309 Electrical Characteristics (Ta = 25C) Characteristic Collector cut-off current RN1307 Emitter cut-off current RN1308 RN1309 RN1307 DC current gain RN1308 RN1309 Collector-emitter saturation voltage RN1307 Input voltage (ON) RN1308 RN1309 RN1307 Input voltage (OFF) RN1308 RN1309 Translation frequency Collector output capacitance RN1307 Input resistor RN1308 RN1309 RN1307 Resistor ratio RN1308 RN1309 R1/R2 R1 fT Cob VI (OFF) VI (ON) VCE (sat) hFE IEBO Symbol ICBO ICEO Test Circuit VCE = 10V, IC = 5mA VCB = 10V, IE = 0, f = 1MHz VCE = 5V, IC = 0.1mA VCE = 0.2V, IC = 5mA IC = 5mA, IB = 0.25mA VCE = 5V, IC = 10mA Test Condition VCB = 50V, IE = 0 VCE = 50V, IB = 0 VEB = 6V, IC = 0 VEB = 7V, IC = 0 VEB = 15V, IC = 0 Min 0.081 0.078 0.167 80 80 70 0.7 1.0 2.2 0.5 0.6 1.5 7 15.4 32.9 0.191 0.421 1.92 Typ. 0.1 250 3 10 22 47 0.213 0.468 2.14 Max 100 500 0.15 0.145 0.311 0.3 1.8 2.6 5.8 1.0 1.16 2.6 6 13 28.6 61.1 0.232 0.515 2.35 k MHz pF V V V mA Unit nA 2 2001-06-07 RN1307~RN1309 3 2001-06-07 RN1307~RN1309 4 2001-06-07 RN1307~RN1309 Type Name Marking RN1307 RN1308 Rn1309 5 2001-06-07 RN1307~RN1309 RESTRICTIONS ON PRODUCT USE 000707EAA * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 6 2001-06-07 |
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